Aime Technology Co., Ltd.

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Research & Development

Aime Technology's aggressive R&D is constantly seeking new challenges. One recent area of interest for developing new business opportunities is optical properties.

Film thickness meter

Learn moreThis film thickness meter provides a non-contact, non-destructive method of measuring film thickness. Greater compactness and resistance to noise interference was achieved by employing a laser interferometer and a superluminescent diode (SLD) together with optical fiber in place of the space propagation path of a conventional optical interferometer. This reliable, easy to use film thickness meter can automatically measure up to millimeter-order film thicknesses and layer thicknesses with a resolution of 0.01 millimeter.

• Non-contact, non-destructive measurement of film thickness  • Able to measure extremely small sections
• Able to perform remote measurement  • Easy maintenance

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Optical accessories

Learn moreThis piezoelectric optical path length adjustment unit is comprised of optical fiber wound around cylindrical PZT (lead zirconate titanate) piezoelectric elements. By inserting it into an optical fiber circuit, the optical fiber length adjustment unit can be used for a wide range of applications, such as stabilizing the optical fiber length or optical phase, or performing high-speed scanning. Employing computer control, it is also ideal for fine adjustment of optical fiber length and for repeated quick changes in optical fiber length modulation at the desired waveform.

● Voltage-controlled fine adjustment of optical fiber length  ● Easy connection 
● Stable and reliable; requires no adjustment

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